基于带隙基准的高端理想二极管研究
集成电路应用
陈石平1,郑健超2
1.广东科贸职业学院;2.光大环保能源(永州)有限公司
摘要: 环境温度对电路性能有重要影响,针对温度漂移问题,该研究使用基于带隙基准设计高端理想二极管,电路由高端负载开关MOS管、电压比较器和带隙基准电压模块等构成。电压比较器具有优先迟滞回环传输特性,可提高抗干扰能力;带隙基准电压源具有高精度,电压比较器通过对比MOS管输出端的分压电压与基准电压大小,再控制高端负载开关MOS主管导通与截止。正向、反向偏置仿真表明,电路具有防止倒灌功能和较低的正向压降,可以保护前级电路;整个电路具有较低的静态电流损耗;适用于窄带物联网(NB-IoT)的低损耗应用场景,电路结构简洁,具备低成本优势。温度扫描仿真分析表明带隙基准电压模块具有较好的温度稳定特性,设计的理想二极管电路具有更高的精度和更好的温度特性。
中图分类号:TN710.2文献标识码:ADOI:10.19339/j.issn.1674-2583.2026.01.006
中文引用格式:陈石平,郑健超. 基于带隙基准的高端理想二极管研究[J].集成电路应用,2026,43(01):39-44.
英文引用格式:CHEN Shiping, ZHENG Jianchao. Research on highside ideal diode based on bandgap reference[J].Application of IC,2026,43(01):39-44.
中文引用格式:陈石平,郑健超. 基于带隙基准的高端理想二极管研究[J].集成电路应用,2026,43(01):39-44.
英文引用格式:CHEN Shiping, ZHENG Jianchao. Research on highside ideal diode based on bandgap reference[J].Application of IC,2026,43(01):39-44.
Research on highside ideal diode based on bandgap reference
Chen Shiping1, Zheng Jianchao2
1. Guangdong Polytechnic of Science and Trade; 2. Everbright Environmental Energy (Yongzhou) Co., Ltd.
Abstract: The ambient temperature has an important influence on the performance of the circuit. Aiming at the problem of temperature drift, this paper designs a high-side ideal diode based on bandgap reference. The circuit is composed of a high-side load switch MOS tube, a voltage comparator and a bandgap reference voltage module. The voltage comparator has priority hysteresis loop transmission characteristics, which can improve the anti-interference capacity. The bandgap reference voltage source is of high precision. The voltage comparator controls the conduction and cut-off of the high-side load switch MOS tube by comparing the voltage divider voltage and the reference voltage at the output end of the MOS tube. The forward and reverse bias simulation shows that the circuit has the function of preventing backflow and low forward voltage drop, which can protect the front-end circuit. The whole circuit exhibits low static current loss. It is suitable for the low-loss application scenarios of the narrow-band Internet of Things (NB-IoT). The circuit structure is simple and has budget advantage. The temperature scanning simulation analysis shows that the bandgap reference voltage module presents good temperature stability. The designed ideal diode circuit has higher precision and better temperature characteristics.
Key words : high-side ideal diode;comparator;bandgap reference;temperature scanning
引言
现有基于MOS管的理想二极管[1-2]技术方案,使用齐纳二极管[3]作为基准电压,通过电压比较器比较MOS管源极、漏极的两端电压大小,进而控制MOS管的开启与关闭[4]。其不足之处在于,当稳压值低于6 V发生齐纳击穿时,温度系数为负。当温度升高时,耗尽层(Depletion Layer)宽度减小,耗尽层中的原子价电子(Valence Electron)能量升高至较高水平,较小的电场强度即可将价电子从原子中激发出来,进而产生齐纳击穿。鉴于其温度系数为负,齐纳击穿电压稳定度欠佳(一般稳定度处于±(5%~10%)),若将其作为基准电压,会致使电压比较器精度降低,易引发误判。
在现实物理世界中,半导体元件几乎没有与温度无关的参数,齐纳二极管也不例外。只要能找到一些具有正温度系数和负温度系数的器件,通过合适的组合相互抵消误差,就可以得到与温度、电源无关的量。
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作者信息:
陈石平1,郑健超2
(1.广东科贸职业学院,广东广州510430;
2.光大环保能源(永州)有限公司,湖南永州425000)

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