中图分类号：TN6文献标识码：ADOI:10.19339/j.issn.1674-2583.2026.02.002
中文引用格式：林熹. 电子元器件长期贮存可靠性分析［J］.集成电路应用，2026，43（2）：5-8.
英文引用格式：Lin Xi. Long-term storage reliability analysis of electronic components［J］.Application of IC，2026，43（2）：5-8.

Long-term storage reliability analysis of electronic components

Abstract： Electronic components are the fundamental building blocks of electronic systems, and their reliability during long-term storage is of great significance. From the perspective of current social development, many industries have imposed stringent requirements on electronic equipment, necessitating that the applied devices maintain stable operation even after prolonged storage periods. This research analyzes the factors affecting the long-term storage reliability of electronic components such as tempercoture, humidity, light exposure, EMI, material properties, fabrication process and cumulative effect of storage time and proposes corresponding measures. It is hoped that this work can provide theoretical foundations and practical guidance for the long-term and reliable storage of electronic components, thereby contributing to the robust, sustainable, and long-term development of China′s modern industry.

Key words : electronic component; reliability; factor; measure